New Age Instruments & Materials Pvt. Ltd.

Products

Precision Optics

Non Linear Optics

Opto mechanical components

Spectroscopy Systems

Laser Systems

Light Sources

Laser Measurement Systems

Detectors

Fiber Optics

Adaptive Optics

Thin Film Measurement systems

Semiconductor Systems

Thin film measurement solutions Software Hardware services

Semiconductor, Biotechnology, Magnetic media, Chemistry, Optical coatings, Polymers; Production and R&D

Thin Film Measurement Solutions

We developed, in cooperation with leading manufacturers, a wide range of optical thin-film metrology instruments from high-precision sophisticated ellipsometry and reflectometry systems (spectroscopic, fast single wavelength and Imaging) for research and production applications to low-budget reflectometers for variety of applications

Ellipsometer systems

Ellipsometry is a nondestructive and highly sensitive optical measurement technique used to analyze thin-layer stacks. It is based on the observation that polarized light reflected from the surface with thin layer is changing polarization state, e.g. linearly polarized light will, in general case, change to elliptically polarized - hence, the name "ellipsometry". This change of polarization state can be related to optical thickness of the layer(s).

M-Probe Series Thin-film measurement:Spectral Reflection and Transmission

M-Probe series thin-film measurement system is based on a fiber optics backscattering reflection or transmittance probe.Small, precise, easy to use and low-budget instrument used for in-situ and ex-situ (desktop) measurements - it is a real workhorse in research lab and production

TFCompanion - Optical Metrology Software

TFCompanion is a powerful and user friendly software application for thin film analysis and metrology.It combines versatile analytical tools for interpretation of measurement data - to determine actual physical parameters of a filmstack (like thicknesses of the layers and optical properties of the materials). It allows simulation and sensitivity analysis to understand better why the things are the way they are. TFCompanion gives the ability to estimate measurement/calculation errors, create and optimize measurement recipes and mitigate tradeoffs between measurement accuracy and thruput.